Name: SN74BCT8374ADWR
Brand: Texas Instruments
SKU: SN74BCT8374ADWR
Availability: InStock
Rating: 5 (120 reviews)

SN74BCT8374ADWR

Per Riferimento Soltanto

Numero di parte	SN74BCT8374ADWR
Produttore	Texas Instruments
Descrizione	IC SCAN TEST DEVICE W/FF 24-SOIC
Scheda dati
pacchetto	24-SOIC (0.295", 7.50mm Width)
ECAD
A magazzino	5.968 piece(s)
Prezzo unitario	Request a Quote
Tempi di Consegna	Essere confermato
Tempo di consegna stimato	gen 25 - gen 30 (Scegli una spedizione rapida)
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Specifiche SN74BCT8374ADWR

Produttore	Texas Instruments
Categoria	Circuiti integrati (CI) - Logici - Logica speciale
pacchetto	24-SOIC (0.295", 7.50mm Width)
ECAD
Serie	74BCT
Tipo di logica	Scan Test Device with D-Type Edge-Triggered Flip-Flops
Tensione di alimentazione	4.5 V ~ 5.5 V
Numero di bit	8
temperatura di esercizio	0°C ~ 70°C
Tipo di montaggio	Surface Mount
Pacchetto / caso	24-SOIC (0.295", 7.50mm Width)
Pacchetto dispositivo fornitore	24-SOIC

SN74BCT8374ADWR Packaging

SN74BCT8374ADWR FAQ

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We have a professional and experienced quality control team to strictly verify and test the SN74BCT8374ADWR. All suppliers must pass our qualification reviews before they can publish their products including SN74BCT8374ADWR on Heisener; we pay more attention to the channels and quality of SN74BCT8374ADWR products than any other customer. We strictly implement supplier audits, so you can purchase with confidence.
3. Are the SN74BCT8374ADWR price and inventory displayed accurate?

The price and inventory of SN74BCT8374ADWR fluctuates frequently and cannot be updated in time, it will be updated periodically within 24 hours. And, our quotation usually expires after 5 days.
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Warm Tips: It may take up to 24 hours for the carriers to display tracking information. Usually, express delivery takes 3-5 days, and registered mail takes 25-60 days.
6. What is the process for return or replacement of SN74BCT8374ADWR?

All goods will implement Pre-Shipment Inspection (PSI), selected at random from all batches of your order to do a systematic inspection before arranging the shipment. If there is something wrong with the SN74BCT8374ADWR we delivered, we will accept the replacement or return of the SN74BCT8374ADWR only when all of the below conditions are fulfilled:

(1)Such as a deficiency in quantity, delivery of wrong items, and apparent external defects (breakage and rust, etc.), and we acknowledge such problems.

(2)We are informed of the defect described above within 90 days after the delivery of SN74BCT8374ADWR.

(3)The PartNo is unused and only in the original unpacked packaging.

Two processes to return the products:

(1)Inform us within 90 days

(2)Obtain Requesting Return Authorizations
7.How to contact us to get technical supports, such as SN74BCT8374ADWR pin diagram, SN74BCT8374ADWR datasheet?

If you need any after-sales service, please do not hesitate to contact us.

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SN74BCT8374ADWR garanzie

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Numero di parte

Produttore

Descrizione

Azione

SN74BCT8374ADW

D# V36:1790_07335374

Texas Instruments

Scan Test Device

RoHS: Compliant

Numero di parte

Produttore

Descrizione

Azione

SN74BCT8374ADW

Texas Instruments

Numero di parte	Produttore	Descrizione	Azione
SN74BCT8374ADWR	Texas Instruments	N/A BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24 PLASTIC, SO-24	1000
SN74BCT8374ADW	Texas Instruments	SCAN TEST DEVICE, D-FLIP FLOP SOIC24, Flip-Flop Type:D, Propagation Delay:6.7ns, Supply Voltage Min:4.5V, Supply Voltage Max:5.5V, Logic Case Style:SOIC, No. of Pins:24, Frequency:70MHz, Output Current:64mA, Packaging:Each , RoHS Compliant: Yes	0
SN74BCT8374ADWRG4	Texas Instruments	IC SCAN TEST DEVICE 24SOIC	0
SN74BCT8374ADWRE4	Rochester Electronics LLC	74BCT8374 Flip Flop SN74BCT8374ADWRE4	0

Numero di parte	Produttore	Descrizione	Azione
SN74BCT8374ADWR D# SN74BCT8374ADWR-ND	Texas Instruments	IC SCAN TEST DEVICE W/FF 24-SOIC	0
SN74BCT8374ADWRE4 D# SN74BCT8374ADWRE4-ND	Texas Instruments	IC SCAN TEST DEVICE W/FF 24-SOIC	0
SN74BCT8374ADWRG4 D# SN74BCT8374ADWRG4-ND	Texas Instruments	IC SCAN TEST DEVICE 24SOIC	0
SN74BCT8374ADW D# 296-33849-5-ND	Texas Instruments	IC SCAN TEST DEVICE W/FF 24-SOIC	75

Numero di parte

Produttore

Descrizione

Azione

SN74BCT8374ADW

OEM/CM QUOTES ONLY | NO BROKERS

3154

SN74BCT8374ADWR

OEM/CM QUOTES ONLY | NO BROKERS

2378

Numero di parte	Produttore	Descrizione	Azione
SN74BCT8374ADWRE4	Texas Instruments	OEM/CM ONLY	306
SN74BCT8374ADWR	Texas Instruments	OEM/CM ONLY	1060
SN74BCT8374ADW	Texas Instruments	OEM/CM ONLY	862
SN74BCT8374ADWR00	Texas Instruments	OEM/CM ONLY	536

Numero di parte

Produttore

Descrizione

Azione

SN74BCT8374ADW

D# 595-SN74BCT8374ADW

Texas Instruments

Specialty Function Logic Device w/Octal D-Typ Edge-Trig Flip-Flop

RoHS: Compliant

104

Numero di parte	Produttore	Descrizione	Azione
SN74BCT8374ADWRG4 D# NS-SN74BCT8374ADWRG4	Texas Instruments	OEM/CM ONLY	5376
SN74BCT8374ADW D# NS-SN74BCT8374ADW	Texas Instruments	OEM/CM ONLY	5626
SN74BCT8374ADWR D# NS-SN74BCT8374ADWR	Texas Instruments	OEM/CM ONLY	5215
SN74BCT8374ADWRE4 D# NS-SN74BCT8374ADWRE4	Texas Instruments	OEM/CM ONLY	1821

Numero di parte

Produttore

Descrizione

Azione

SN74BCT8374ADWR

Texas Instruments

OEM/CM ONLY

3020

SN74BCT8374ADW

Texas Instruments

OEM/CM ONLY

3797

Numero di parte

Produttore

Descrizione

Azione

SN74BCT8374ADW

Texas Instruments

Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops

996

Numero di parte

Produttore

Descrizione

Azione

SN74BCT8374ADW

Texas Instruments

shipping today

3009

Numero di parte

Produttore

Descrizione

Azione

SN74BCT8374ADW

Texas Instruments

RFQ

9504

Quick Inquiry

SN74BCT8374ADWR

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